On the Detectability of Scan Chain Internal Faults An Industrial Case Study
In: 26th IEEE VLSI Test Symposium; (2008-04-01) S. 79-84
Online
Konferenz
Zugriff:
Titel: |
On the Detectability of Scan Chain Internal Faults An Industrial Case Study
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Autor/in / Beteiligte Person: | Yang, Fan ; Chakravarty, Sreejit ; Devta-Prasanna, Narendra ; Reddy, Sudhakar M ; Pomeranz, Irith |
Link: | |
Quelle: | 26th IEEE VLSI Test Symposium; (2008-04-01) S. 79-84 |
Veröffentlichung: | 2008 |
Medientyp: | Konferenz |
ISBN: | 978-0-7695-3123-6 (print) ; 0-7695-3123-7 (print) |
ISSN: | 1093-0167 (print) ; 2375-1053 (print) |
DOI: | 10.1109/VTS.2008.13 |
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