At-speed transition fault testing with low speed scan enable
In: Proceedings. 23rd IEEE VLSI Test Symposium; (2005) S. 42-47
Online
Konferenz
Zugriff:
Titel: |
At-speed transition fault testing with low speed scan enable
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Autor/in / Beteiligte Person: | Ahmed, N. ; Ravikumar, C.P. ; Tehranipoor, M. ; Plusquellic, J. |
Link: | |
Quelle: | Proceedings. 23rd IEEE VLSI Test Symposium; (2005) S. 42-47 |
Veröffentlichung: | 2005 |
Medientyp: | Konferenz |
ISBN: | 0-7695-2314-5 (print) ; 978-0-7695-2314-9 (print) |
ISSN: | 1093-0167 (print) ; 2375-1053 (print) |
DOI: | 10.1109/VTS.2005.31 |
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