Study of Front-Side Approach to Retrieve Stored Data in Non-Volatile Memory Devices Using Scanning Capacitance Microscopy
In: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA, 2019
Online
Konferenz
Zugriff:
Titel: |
Study of Front-Side Approach to Retrieve Stored Data in Non-Volatile Memory Devices Using Scanning Capacitance Microscopy
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Autor/in / Beteiligte Person: | Tay, J.Y. ; Cheah, J. ; Liu, Q. ; Gan, C.L |
Link: | |
Zeitschrift: | 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA, 2019 |
Veröffentlichung: | IEEE, 2019 |
Medientyp: | Konferenz |
DOI: | 10.1109/ipfa47161.2019.8984802 |
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