Analysis of Random Variation in Subthreshold FGMOSFET.
In: Active & Passive Electronic Components, 2016-07-28, S. 1-10
Online
academicJournal
Zugriff:
Titel: |
Analysis of Random Variation in Subthreshold FGMOSFET.
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Autor/in / Beteiligte Person: | Banchuin, Rawid |
Link: | |
Zeitschrift: | Active & Passive Electronic Components, 2016-07-28, S. 1-10 |
Veröffentlichung: | 2016 |
Medientyp: | academicJournal |
ISSN: | 0882-7516 (print) |
DOI: | 10.1155/2016/3741250 |
Sonstiges: |
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