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In: Proceeding IEEE International symposium on the Physical and Failure Analysis of integrated circuits (IPFA'07) ; IEEE International symposium on the Physical and Failure Analysis of integrated circuits (IPFA'07) ; https://hal.archives-ouvertes.fr/hal-00162196 ; IEEE International symposium on the Physical and Failure Analysis of integrated circuits (IPFA'07), Jul 2007, Bangalore, India. pp.6-1, 2007KonferenzZugriff:
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In: Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) ; 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2007 ; https://hal.archives-ouvertes.fr/hal-00204582 ; 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2007, Jul 2007, Bangalore, India. pp.229-234, 10.1109/IPFA.2007.4378090, ⟨10.1109/IPFA.2007.4378090⟩, 2007KonferenzZugriff: