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42 Treffer

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  1. Detailansicht für Treffer 1 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  2. Detailansicht für Treffer 2 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  3. Detailansicht für Treffer 3 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  4. Detailansicht für Treffer 4 öffnen
    A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
    Matana Luza, Lucas ; Ruospo, Annachiara ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266848 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  5. Detailansicht für Treffer 5 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  6. Detailansicht für Treffer 6 öffnen
    A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
    Matana Luza, Lucas ; Ruospo, Annachiara ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266848 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  7. Detailansicht für Treffer 7 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  8. Detailansicht für Treffer 8 öffnen
    A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
    Matana Luza, Lucas ; Ruospo, Annachiara ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266848 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  9. Detailansicht für Treffer 9 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  10. Detailansicht für Treffer 10 öffnen
    A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
    Matana Luza, Lucas ; Ruospo, Annachiara ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266848 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  11. Detailansicht für Treffer 11 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  12. Detailansicht für Treffer 12 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  13. Detailansicht für Treffer 13 öffnen
    A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
    Matana Luza, Lucas ; Ruospo, Annachiara ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266848 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  14. Detailansicht für Treffer 14 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  15. Detailansicht für Treffer 15 öffnen
    A Model-Based Framework to Assess the Reliability of Safety-Critical Applications
    Matana Luza, Lucas ; Ruospo, Annachiara ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266848 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.41-44, ⟨10.1109/DDECS52668.2021.9417059⟩, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  16. Detailansicht für Treffer 16 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  17. Detailansicht für Treffer 17 öffnen
    AdequateDL: Approximating Deep Learning Accelerators
    Sentieys, Olivier ; Filip, Silviu-Ioan ; et al.
    In: DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems ; https://hal.science/hal-03266861 ; DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩ ; http://www.ddecs2021.wien/, 2021
    Online Konferenz
    Zugriff:
    Volltext
    Wie komme ich dran?
  18. Detailansicht für Treffer 18 öffnen
    Tutorial: Silicon Systems for Wireless LAN
    Stamenkovic, Zoran ; Aziza, Hassen ; et al.
    In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ; https://hal.science/hal-03266853 ; 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna, Austria. pp.157-158, ⟨10.1109/DDECS52668.2021.9417056⟩, 2021
    Konferenz
    Wie komme ich dran?
  19. Detailansicht für Treffer 19 öffnen
    Tutorial: Silicon Systems for Wireless LAN
    Stamenkovic, Zoran ; Aziza, Hassen ; et al.
    In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ; https://hal.science/hal-03266853 ; 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna, Austria. pp.157-158, ⟨10.1109/DDECS52668.2021.9417056⟩, 2021
    Konferenz
    Wie komme ich dran?
  20. Detailansicht für Treffer 20 öffnen
    Efficient Neural Network Approximation via Bayesian Reasoning
    Savino, Alessandro ; Traiola, Marcello ; et al.
    In: 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) ; https://hal.science/hal-03266825 ; 2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna, Austria. pp.45-50, ⟨10.1109/DDECS52668.2021.9417057⟩, 2021
    Konferenz
    Wie komme ich dran?
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