Suchergebnisse
Katalog
Artikel & mehr
Suchmaske
Suchergebnisse einschränken oder erweitern
Aktive Suchfilter
Weniger Treffer
Art der Quelle
Thema
- 3d 2 Treffer
- cmos integrated circuits 2 Treffer
- components, circuits, devices and systems 2 Treffer
- engineered materials, dielectrics and plasmas 2 Treffer
- frequency measurement 2 Treffer
-
18 weitere Werte:
- grounding device 2 Treffer
- inductors 2 Treffer
- integrated circuit modeling 2 Treffer
- integrated inductors 2 Treffer
- s-parameter 2 Treffer
- spirals 2 Treffer
- three dimensional displays 2 Treffer
- through silicon via (tsv) 2 Treffer
- communication, networking and broadcast technologies 1 Treffer
- computing and processing 1 Treffer
- electrical resistance measurement 1 Treffer
- impedance 1 Treffer
- inductance measurement 1 Treffer
- periodic structures 1 Treffer
- photonics and electrooptics 1 Treffer
- power, energy and industry applications 1 Treffer
- resistance 1 Treffer
- through-silicon vias 1 Treffer
Publikation
- 2012 ieee workshop on microelectronics & electron devices 1 Treffer
- 2012 ieee workshop on microelectronics and electron devices, microelectronics and electron devices (wmed), 2012 ieee workshop on 1 Treffer
- 2013 ieee international conference on microelectronic test structures (icmts), microelectronic test structures (icmts), 2013 ieee international conference on 1 Treffer
- ieee international conference on microelectronic test structures 1 Treffer
Sprache
Inhaltsanbieter
2 Treffer
-
In: 2012 IEEE Workshop on Microelectronics and Electron Devices, 2012-04-01, S. 1-4Online KonferenzZugriff:
-
In: 2013 IEEE International Conference on Microelectronic Test Structures (ICMTS), 2013-03-01, S. 33-36Online KonferenzZugriff: