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Weniger Treffer
Art der Quelle
Thema
- electronic, optical and magnetic materials 893 Treffer
- condensed matter physics 623 Treffer
- surfaces, coatings and films 436 Treffer
- safety, risk, reliability and quality 418 Treffer
- atomic and molecular physics, and optics 404 Treffer
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45 weitere Werte:
- biotechnology 137 Treffer
- materials chemistry 57 Treffer
- industrial and manufacturing engineering 50 Treffer
- control and systems engineering 42 Treffer
- radiation 25 Treffer
- software 17 Treffer
- applied mathematics 16 Treffer
- energy engineering and power technology 16 Treffer
- instrumentation 16 Treffer
- computer networks and communications 15 Treffer
- computer science applications 12 Treffer
- general materials science 11 Treffer
- computer graphics and computer-aided design 9 Treffer
- general computer science 9 Treffer
- general physics and astronomy 7 Treffer
- hardware and architecture 7 Treffer
- signal processing 7 Treffer
- general engineering 6 Treffer
- nuclear and high energy physics 5 Treffer
- nuclear energy and engineering 5 Treffer
- atomic and molecular physics 4 Treffer
- engineering 4 Treffer
- applied physics 3 Treffer
- ceramics and composites 3 Treffer
- electronic 3 Treffer
- esd 3 Treffer
- geotechnical engineering and engineering geology 3 Treffer
- mechanical engineering 3 Treffer
- modeling and simulation 3 Treffer
- physical sciences 3 Treffer
- reliability and quality 3 Treffer
- risk 3 Treffer
- safety 3 Treffer
- surfaces 3 Treffer
- surfaces and interfaces 3 Treffer
- and optic 2 Treffer
- and optics 2 Treffer
- artificial intelligence 2 Treffer
- coatings and film 2 Treffer
- condensed matter physic 2 Treffer
- condition assessment of power transformers 2 Treffer
- electrical engineering 2 Treffer
- electrostatic discharge protection in integrated circuits 2 Treffer
- fos electrical engineering, electronic engineering, information engineering 2 Treffer
- fos mathematics 2 Treffer
Verlag
- institute of electrical and electronics engineers (ieee) 638 Treffer
- elsevier bv 483 Treffer
- wiley 45 Treffer
- springer science and business media llc 12 Treffer
- emerald 8 Treffer
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15 weitere Werte:
- informa uk limited 8 Treffer
- escholarship, university of california 3 Treffer
- american scientific publishers 2 Treffer
- ieee computer society 2 Treffer
- institute of electrical and electronics engineers inc. 2 Treffer
- openalex 2 Treffer
- sage publications 2 Treffer
- american chemical society (acs) 1 Treffer
- bentham science publishers ltd. 1 Treffer
- eastern mediterranean university emu 1 Treffer
- ieee 1 Treffer
- inderscience publishers 1 Treffer
- project muse 1 Treffer
- walter de gruyter gmbh 1 Treffer
- world scientific and engineering academy and society (wseas) 1 Treffer
Publikation
- ieee transactions on electronics packaging manufacturing ; volume 23, issue 4, page 235-235 ; issn 1521-334x 1558-0822 3 Treffer
- circuit world ; volume 35, issue 1 ; issn 0305-6120 1 Treffer
- electrical engineering in japan ; volume 215, issue 1 ; issn 0424-7760 1520-6416 1 Treffer
- ieee electrical insulation magazine ; volume 13, issue 3, page 62-62 ; issn 0883-7554 1558-4402 1 Treffer
- ieee electron device letters ; page 1-1 ; issn 0741-3106 1558-0563 1 Treffer
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28 weitere Werte:
- ieee geoscience and remote sensing letters ; volume 19, page 1-5 ; issn 1545-598x 1558-0571 1 Treffer
- ieee journal of the electron devices society ; page 1-1 ; issn 2168-6734 1 Treffer
- ieee transactions on applied superconductivity ; volume 31, issue 8, page 1-4 ; issn 1051-8223 1558-2515 2378-7074 1 Treffer
- ieee transactions on electron devices ; page 1-6 ; issn 0018-9383 1557-9646 1 Treffer
- ieee transactions on electron devices ; page 1-8 ; issn 0018-9383 1557-9646 1 Treffer
- ieee transactions on geoscience and remote sensing ; volume 62, page 1-15 ; issn 0196-2892 1558-0644 1 Treffer
- ieee transactions on microwave theory and techniques ; issn 0018-9480 1557-9670 1 Treffer
- inpharma weekly ; volume &na;, issue 1606, page 15 ; issn 1173-8324 1 Treffer
- international journal of circuit theory and applications ; issn 0098-9886 1097-007x 1 Treffer
- international journal of electronics ; page 1-20 ; issn 0020-7217 1362-3060 1 Treffer
- international journal of numerical modelling: electronic networks, devices and fields ; volume 35, issue 3 ; issn 0894-3370 1099-1204 1 Treffer
- journal of electrostatics ; issn 0304-3886 1 Treffer
- microelectronics reliability ; issn 0026-2714 1 Treffer
- microelectronics reliability ; issn: 0026-2714 1 Treffer
- microelectronics reliability ; volume 23, issue 3, page 587 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 24, issue 5, page 987 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 27, issue 3, page 592 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 28, issue 5, page 825 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 29, issue 5, page 887 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 30, issue 3, page 625 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 32, issue 4, page 584 ; issn 0026-2714 1 Treffer
- microelectronics reliability ; volume 32, issue 9, page 1344 ; issn 0026-2714 1 Treffer
- modernism/modernity print plus ; volume 1, issue 1 1 Treffer
- nano-micro letters ; volume 13, issue 1 ; issn 2311-6706 2150-5551 1 Treffer
- physica status solidi (a) ; volume 220, issue 2 ; issn 1862-6300 1862-6319 1 Treffer
- soldering & surface mount technology ; volume 12, issue 3 ; issn 0954-0911 1 Treffer
- soldering & surface mount technology ; volume 13, issue 1 ; issn 0954-0911 1 Treffer
- soldering & surface mount technology ; volume 24, issue 3 ; issn 0954-0911 1 Treffer
Sprache
Inhaltsanbieter
1.222 Treffer
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In: IEEE Access ; volume 12, page 33555-33568 ; ISSN 2169-3536, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices ; volume 71, issue 1, page 151-166 ; ISSN 0018-9383 1557-9646, 2024Online academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society ; volume 11, page 84-94 ; ISSN 2168-6734, 2023Online academicJournalZugriff:
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In: IEEE Electron Device Letters ; volume 44, issue 9, page 1531-1534 ; ISSN 0741-3106 1558-0563, 2023Online academicJournalZugriff:
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In: IEEE Access ; volume 11, page 108938-108943 ; ISSN 2169-3536, 2023Online academicJournalZugriff:
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In: IEEE Transactions on Electromagnetic Compatibility ; volume 65, issue 3, page 634-642 ; ISSN 0018-9375 1558-187X, 2023Online academicJournalZugriff:
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In: IEEE Access ; volume 11, page 37472-37482 ; ISSN 2169-3536, 2023Online academicJournalZugriff:
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In: IEEE Access ; volume 11, page 11422-11429 ; ISSN 2169-3536, 2023Online academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society ; page 1-1 ; ISSN 2168-6734, 2023Online academicJournalZugriff:
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In: International Journal of Circuit Theory and Applications ; ISSN 0098-9886 1097-007X, 2024academicJournalZugriff:
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In: IEEE Electron Device Letters ; page 1-1 ; ISSN 0741-3106 1558-0563, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices ; volume 71, issue 1, page 510-515 ; ISSN 0018-9383 1557-9646, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Geoscience and Remote Sensing ; volume 62, page 1-15 ; ISSN 0196-2892 1558-0644, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices ; page 1-8 ; ISSN 0018-9383 1557-9646, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices ; volume 71, issue 3, page 2247-2252 ; ISSN 0018-9383 1557-9646, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electron Devices ; volume 71, issue 1, page 167-172 ; ISSN 0018-9383 1557-9646, 2024Online academicJournalZugriff:
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In: IEEE Transactions on Electromagnetic Compatibility ; volume 64, issue 6, page 1890-1898 ; ISSN 0018-9375 1558-187X, 2022Online academicJournalZugriff:
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In: IEEE Journal of the Electron Devices Society ; volume 10, page 876-884 ; ISSN 2168-6734, 2022Online academicJournalZugriff:
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In: Microelectronics Reliability ; volume 138, page 114661 ; ISSN 0026-2714, 2022academicJournalZugriff:
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In: IEEE Transactions on Electron Devices, vol 63, iss 8, 2016academicJournalZugriff: