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37 weitere Werte:
- application specific integrated circuits 1 Treffer
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- isolation technology 1 Treffer
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- microelectronics 1 Treffer
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- random telegraph noise (rtn) 1 Treffer
- semiconductor materials 1 Treffer
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- time dependent dielectric breakdown (tddb) 1 Treffer
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Publikation
- 2010 17th ieee international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits (ipfa), 2010 17th ieee international symposium on the 2 Treffer
- 2007 14th international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits, 2007. ipfa 2007. 14th international symposium on the 1 Treffer
- 2009 16th ieee international symposium on the physical and failure analysis of integrated circuits, physical and failure analysis of integrated circuits, 2009. ipfa 2009. 16th ieee international symposium on the 1 Treffer
- proceedings of the 12th international symposium on the physical and failure analysis of integrated circuits, 2005. ipfa 2005., physical and failure analysis of integrated circuits, 2005. ipfa 2005. proceedings of the 12th international symposium on the, physical and failure analysis of integrated circuits 1 Treffer
Inhaltsanbieter
5 Treffer
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In: Proceedings of the 12th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2005. IPFA, 2005, S. 176-180Online KonferenzZugriff:
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In: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2010-07-01, S. 1-12Online KonferenzZugriff:
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In: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2010-07-01, S. 1-4Online KonferenzZugriff:
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In: 2009 16th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2009-07-01, S. 24Online KonferenzZugriff:
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In: 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, 2007-07-01, S. 44Online KonferenzZugriff: