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In: 2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2012, S. 1-4Online KonferenzZugriff:
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In: 2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2012, S. 1-4Online KonferenzZugriff:
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A simple solution for low-driving-current output buffer failed at the low voltage ESD zapping event.In: 2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2012, S. 1-5Online KonferenzZugriff:
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In: 2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2012, S. 1-6Online KonferenzZugriff:
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In: 2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2012, S. 1-4Online KonferenzZugriff:
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In: 2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2012, S. 1-4Online KonferenzZugriff: